THERMO-MECHANICAL TEST:
Thermal cycling: Single chamber climatic oven.
   Test conditions: 10°C/minute ramp rate between 150°C et -40°C.
 
Thermal shocks: Dual chamber climatic oven.
   Test conditions: between 170°C et -65°C.
   Accelerated stress test with fast transitions between the hot and cold chambers.
 
HAST (Highly Accelerated Stress Test) :
   Test conditions: temperature between 110°C et 135°C with a humidity rate bewteen
   50% et 85%.Highly accelerated stress test under humidity and pressure typically applied
   on biased components.
 
Dry heat:
   Test conditions: temperature between 20°C et 97°C a humidity rate between 30% et 90%.
   Accelerated stress test under humidity and bias.
 
Damp heat :
   Test conditions: temperature between 20°C et 97°C a humidity rate between 30% et 90%.
 
For reliability and qualification test programs, the equipment can be used in conjunction with various test benches:
 
• Continuous electrical monitoring:
 
   Monitoring of the electrical resistance of component assemblies during accelerated ageing tests with ANATECH test benches and according to the IPC-9701 standard.
   Test conditions:
   Record of opens >200ns on 256 channels per test bench (we dispose of 5 ANATECH test benches). Static electrical measurements before and after tests in order to check for possible drifts of the resistance values of tested assemblies.
 
• Tests SIR (Surface Insulation Resistance):
 
   Electrical monitoring of the insulation resistance of comb patterns or component assemblies under 85°C/85%HR  temperature/humidity to evaluate the compatibility of materials/processes like solder paste/cleaning process, solder  paste/solder mask …
   Test conditions:
     Measurements sampled every 20 minutes with a 256-channel test bench internally developped by CERB. Validation of the results after completion of the tests.
 
• Development of specific test benches adapted to customer needs :
 
    - Detection of nano opens on connectors during vibration tests
    - ON/OFF power cycling test bench for electronic components.
Test equipement:
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